Programmable High and Low Temperature Test Chamber ZhongZhi CZ-UH-20D

Name: Programmable High and Low Temperature Test Chamber ZhongZhi CZ-UH-20D
Brand: ZHONGZHI
SKU: CZ-UH-20D
Availability: InStock
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CZ-UH-20D

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Specification

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Product details

Programmable high and low temperature test chamber is suitable for three-temperature (high temperature/normal temperature/low temperature) testing of semiconductors/chips/electronic components and other products, as well as micro-component testing.

Structural Characteristics

Compact footprint: Miniature high-low temperature test chamber that fits directly on your desk
No space constraints: Suitable for office buildings, workplaces, and R&D laboratories
No power hassles: 220V power supply ensures universal compatibility and easy maintenance
Low energy consumption: 40% energy savings, using just 1 kWh per hour
Stable performance: Runs continuously for over 1,000 hours.

Meets the Test Standards

GJB150.3A-2009 High Temperature Test Method
GJB150.4A-2009 Low Temperature Test Method
GB/T 2423.1-2008 (IEC 60068-2-1:2007) Test Ab: Low Temperature
GB/T 2423.2-2008 (IEC 60068-2-2:2007) Test Bb: High Temperature

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Programmable High and Low Temperature Test Chamber ZhongZhi CZ-UH-20D

Datasheet
CZ-UH-20D

Manual
CZ-UH-20D